Abstract: Classifying wafer defects in the wafer manufacturing process is increasingly critical for ensuring high-quality production, optimizing processes, and reducing costs. Most existing methods ...

Abstract: The computing power network (CPN) overcomes the limitations of single-point computing performance by integrating computing and network resources. Latency and energy consumption during the ...

Quantum computers of the future may be closer to reality thanks to new research from Caltech and Oratomic, a Caltech-linked start-up company. Theorists and experimentalists teamed up to develop a new ...